KOREXAN KXN-FESEM-TS Field Emission Scanning Electron Microscope (FESEM) System
Overview
The KOREXAN FESEM System is ideally suited for nanotechnology, materials science,
semiconductor research, metallurgy, polymers and composites, ceramics, battery materials,
catalysts, pharmaceuticals, life sciences, biomaterials, failure analysis, corrosion
studies, thin films, coatings, academic research, and advanced industrial quality
control. Whether supporting breakthrough scientific discoveries or routine analytical
workflows, the KOREXAN KXN-FESEM-TS combines cutting-edge electron
microscopy technology, intelligent automation, and exceptional engineering to deliver
superior imaging performance, accurate material characterization, and reliable analytical
results for modern laboratories worldwide.
Key Features
- High-Brightness Cold Field Emission Gun (CFEG)
- Advanced Aberration-Corrected Electron Optical Column
- Excellent Low-kV Imaging with Superior Contrast
- Multiple Detector Architecture (SE, BSE, Optional EDS/EBSD/STEM)
Specifications
| Parameter | Value |
|---|---|
| Electron Source | Cold Field Emission Gun (CFEG) |
| Electron Optical Column | Advanced Aberration-Corrected Electron Optics |
| EBSD Capability | High-Speed, High-Sensitivity |
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